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Scanning electron microscopy and x-ray microanalysis /

Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.]. - 3rd ed. - New York : Kluwer Academic/Plenum Publishers, c2003. - xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)

Includes bibliographical references and index.

ISBN: 0306472929

LCCN: 2002028276

Subjects--Topical Terms:
Scanning electron microscopy.
X-ray microanalysis.

LC Class. No.: QH212.S3 / S29 2003

Dewey Class. No.: 502/.8/25

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Scanning electron microscopy and x-ray microanalysis /

BGMEA University of Fashion and Technology
University Library