Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
Material type: TextPublication details: New York : Kluwer Academic/Plenum Publishers, c2003.Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)ISBN:- 0306472929
- 502/.8/25 21
- QH212.S3 S29 2003
Item type | Current library | Home library | Call number | Copy number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
Books | BUFT Library | BUFT Library | 502.825 S2832 2003 (Browse shelf(Opens below)) | C-1 | Available | 2011-0053 |
Total holds: 0
Includes bibliographical references and index.
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