Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].

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Material type: Text

TextPublication details: New York : Kluwer Academic/Plenum Publishers, c2003.Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)ISBN:

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode	Item holds
Books	BUFT Library	BUFT Library	502.825 S2832 2003 (Browse shelf(Opens below))	C-1	Available		2011-0053

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Includes bibliographical references and index.

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